High-performance defect and film thickness inspection device for films 'Easy Inspect'
High-precision defect detection capability that can detect up to 30,000 defects per second! A high-performance defect and film thickness inspection device capable of detecting defects as small as 10μm for films!
The Media Research Institute's "Easy Inspect" is a device that detects scratches and dirt on films, non-woven fabrics, coatings, and more. It has a high-speed and high-precision defect detection capability, able to detect up to 30,000 defects per second, and can identify defects as small as 10μm. By using the optional software "Easy Measure," it can simultaneously measure the thickness distribution of the entire film in real time while detecting defects. 【Features】 ■ High-speed and high-precision defect detection capability ■ Film thickness monitoring capability ■ Low cost and space-saving ■ Proven track record in mass production lines exceeding 300 meters per minute ■ Detection of periodic and streak defects *For more details, please request documentation or view the PDF data available for download.
- 企業：メディア研究所
- 価格：Other
